Hitachi S-3400N Scanning Electron Microscope

Hitachi S-3400N Scanning Electron Microscope

Scanning Electron Microscope

The Hitachi S-3400N SEM is a high performance, user-friendly scanning electron microscope with new improvements that allow the best results for a wide range of applications. Specifications include:

  • 5x to 300,000x magnification
  • Up to 3 nm resolution
  • 0.3 kV to 30 kV acceleration voltage
  • Up to 30 fps scanning speed
  • Up to 5120 x 3840 pixel image resolution

Resources:
Manual